Software training,tutorials,download,torrentTestMAX ATPG
Advanced Pattern Generation
Synopsys TestMAX™ ATPG is Synopsys’ state-of-the-art pattern generation solution that enables design teams to meet their test quality and cost goals with unprecedented speed. It delivers unparalleled runtime, ensuring patterns are ready when early silicon samples are available for testing. In addition, it generates significantly fewer patterns than existing solutions, allowing designers to reduce the time and cost of testing silicon parts, or increase test quality without impacting test cost. TestMAX ATPG is integrated with Synopsys’ patented TestMAX DFT.
Features
- Highly optimized, memory-efficient test generation, and fault simulation engines for order-of-magnitude faster ATPG runtime compared to previous technologies
- Fine-grained multithreading across multiple cores overcomes memory bottlenecks
- Identical test coverage and pattern reduction across different server configurations and machines for consistent analysis
- Production-proven rule checking, design modeling, and fault modeling for easy, risk-free deployment
- Integration with TestMAX Diagnosis for consistency with defective silicon diagnostic results
- Advanced fault models for achieving extremely high test quality, standard and slack-based transition, cell-aware, static/dynamic bridging, path delay, and hold-time
- Interfaces with PrimeTime®, StarRC™, and HSPICE® for easy access to physical and timing data used by the models
- IDDQ pattern generation and validation using VCS® for quiescent state testing
- Power-aware pattern generation for limiting power consumption during shift and capture
Product: Synopsys TetraMax 2018
Version: 2018_12
Supported Architectures: x64
Language: english
Supported Operating Systems: RHEL 6.X、CentOS 6.X
Size: 1DVD