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TracePro® is a general raytracing program for illumination analysis, optical analysis, radiometry analysis, and photometry analysis. It is the first optics software to be based on the industry-standard ACIS solid modeling kernel from Spatial, Inc. It is also the first software to combine true solid modeling, powerful optical analysis features, strong data exchange capabilities, and an enjoyable graphical interface.
FeaturesTracePro has a full set of features for solving your illumination design and optical analysis problems. TracePro Expert, our flagship edition includes many advanced features as well. The following is a brief summary of TracePro features.
CAD graphical interface including interactive zoom, pan, and rotate, render, wireframe.
Object-oriented Windows code for unlimited capability.
Comprehensive geometry modeling – any CAD solid model can be imported into TracePro and ray-traced.
CAD data exchange – import any SAT file (included with all TracePro editions), or IGES or STEP file (option).
Healing module lets you repair faulty geometry imported from other CAD programs (option).
Lens design file import (option) from OSLO, CODE V®, ZEMAX®, ACCOS V™, or Sigma™.
Silhouette, wireframe, and rendered viewing modes with graphical editing capability.
Complete solid modeling capability including Boolean operations (intersect, subtract, and unite).
Solid Object editing features: Move, Rotate, Scale, Cut, Copy, Paste, Insert.
Surface editing features: Sweep and Revolve.
Comprehensive macro language (Scheme) allows complete automation of TracePro including optimization loops.
Monte Carlo ray tracing with variance reduction techniques (ray splitting and importance sampling).
Properties database including many standard properties, plus user-defined properties.
Material Properties including optical glasses, infrared materials, plastics, and more. Materials can vary versus wavelength and temperature.
Bulk Scatter Properties including models for biological tissue.
User-defined Bulk Scatter Properties (Expert edition) let you program your own models in a DLL.
Surface Properties including versatile scattering model for BRDF and BTDF. Surface properties can vary versus wavelength, angle of incidence, and temperature.
Gradient Index Properties, with all popular models and dependence on wavelength and temperature.
Thin Film Stack Properties for modeling multi-layer optical coatings. Variation versus temperature.
RepTile™ Properties (Expert edition) for modeling repetitive micro-structures for display applications and Fresnel lenses.
Aperture diffraction model for stray light predictions.
Diffraction gratings with unlimited user-defined diffraction efficiencies, varying versus angle of incidence, wavelength, and temperature.
Two ray-tracing modes for all your analysis needs.
Polarization modeling using Stokes vectors and Mueller matrices.
Powerful and extensive source modeling.
Grid sources for regular or random grids of rays. Model virtual sources (sun), lasers, or point sources.
Surface sources can be applied to any surface, even those imported from CAD programs.
Sources specified by flux (lumens or watts) or illuminance/irradiance (lux or watts/m2).
Powerful and flexible Blackbody/Graybody/Thermal source modeling.
Import Radiant Imaging ProSource® source files.
Define your own source using TracePro’s source file format or create one using TracePro results.
Bitmap Source (optional) module lets you use an image file (bmp, gif, jpg, or tif) as a source.
Graphical and tabular output.
Illuminance/Irradiance distribution for any surface in your model.
Candela/Intensity distributions in four different formats. Export IESNA file or eulumdat file.
Polarization state plot for any surface in your model.
Flux report gives detailed tabulation of flux by surface and object.
Incident Ray table shows all ray data for any surface in your model.
Ray History Table shows the history of all rays reaching any surface in your model.
Ray Path Table summarizes flux reaching any surface, sorted by ray path.
CAD graphical interface including interactive zoom, pan, and rotate, render, wireframe.
Object-oriented Windows code for unlimited capability.
Comprehensive geometry modeling – any CAD solid model can be imported into TracePro and ray-traced.
CAD data exchange – import any SAT file (included with all TracePro editions), or IGES or STEP file (option).
Healing module lets you repair faulty geometry imported from other CAD programs (option).
Lens design file import (option) from OSLO, CODE V®, ZEMAX®, ACCOS V™, or Sigma™.
Silhouette, wireframe, and rendered viewing modes with graphical editing capability.
Complete solid modeling capability including Boolean operations (intersect, subtract, and unite).
Solid Object editing features: Move, Rotate, Scale, Cut, Copy, Paste, Insert.
Surface editing features: Sweep and Revolve.
Comprehensive macro language (Scheme) allows complete automation of TracePro including optimization loops.
Monte Carlo ray tracing with variance reduction techniques (ray splitting and importance sampling).
Properties database including many standard properties, plus user-defined properties.
Material Properties including optical glasses, infrared materials, plastics, and more. Materials can vary versus wavelength and temperature.
Bulk Scatter Properties including models for biological tissue.
User-defined Bulk Scatter Properties (Expert edition) let you program your own models in a DLL.
Surface Properties including versatile scattering model for BRDF and BTDF. Surface properties can vary versus wavelength, angle of incidence, and temperature.
Gradient Index Properties, with all popular models and dependence on wavelength and temperature.
Thin Film Stack Properties for modeling multi-layer optical coatings. Variation versus temperature.
RepTile™ Properties (Expert edition) for modeling repetitive micro-structures for display applications and Fresnel lenses.
Aperture diffraction model for stray light predictions.
Diffraction gratings with unlimited user-defined diffraction efficiencies, varying versus angle of incidence, wavelength, and temperature.
Two ray-tracing modes for all your analysis needs.
Polarization modeling using Stokes vectors and Mueller matrices.
Powerful and extensive source modeling.
Grid sources for regular or random grids of rays. Model virtual sources (sun), lasers, or point sources.
Surface sources can be applied to any surface, even those imported from CAD programs.
Sources specified by flux (lumens or watts) or illuminance/irradiance (lux or watts/m2).
Powerful and flexible Blackbody/Graybody/Thermal source modeling.
Import Radiant Imaging ProSource® source files.
Define your own source using TracePro’s source file format or create one using TracePro results.
Bitmap Source (optional) module lets you use an image file (bmp, gif, jpg, or tif) as a source.
Graphical and tabular output.
Illuminance/Irradiance distribution for any surface in your model.
Candela/Intensity distributions in four different formats. Export IESNA file or eulumdat file.
Polarization state plot for any surface in your model.
Flux report gives detailed tabulation of flux by surface and object.
Incident Ray table shows all ray data for any surface in your model.
Ray History Table shows the history of all rays reaching any surface in your model.
Ray Path Table summarizes flux reaching any surface, sorted by ray path.