IC-CAP (Integrated Circuit Characterization and Analysis Program) is a device modeling program that provides powerful characterization and analysis capabilities for all of today's semiconductor modeling processes.

IC-CAP offers device engineers and circuit designers state-of-the-art modeling software that performs numerous modeling needs including instrument control, data acquisition, graphical analysis, simulation, optimization, and statistical analysis.

All of these processes are combined into a flexible and intuitive software environment for efficient and accurate extraction of active device and circuit model parameters. IC-CAP also provides the power to build model libraries for Agilent EEsof EDA and other simulators.

The Target Modeling Extraction Package
The new extraction package, for use with Agilent's Integrated Circuit Characterization and Analysis Program (IC-CAP) software allows engineers to extract CMOS models based on process target data and when available, traditional I-V curves.

Traditional CMOS modeling uses extensive I-V and C-V data for various device geometries. These are typically obtained from time consuming measurements when the process is stable and mature. To extract accurate CMOS models much earlier in the design cycle, Target Modeling uses process control monitor (PCM) data, typically fast single bias point measurements, which are commonly available in the early stages of process development.

The Target Modeling Package includes the following features:

A dedicated User Interface specifically designed for this application
Import of PCM data and related bias information form Excel spreadsheets
Import and display statistical information of PCM data (mean and spread values)
Direct support of BSIM3, BSIM4, PSP and BSIMSOI models
Support for major commercial simulators including Agilent's Advanced Design System (ADS), Cadence's Spectre and Synopsys' HSPICE.
Display, tune and optimize user defined scaling and I-V diagrams
Customizable automatic generation of HTML reports
Open architecture allows import and use of traditional I-V traces in conjunction with PCM data plots.
Package Overview
The Extraction Package includes a dedicated UI main window that manages the PCM data import and the creation of scaling and I-V diagrams. Device information and PCM data are imported directly from excel spreadsheet. Convenient wizards enable you to define subsets of devices and derive PCM data scaling diagrams (e.g. Ion vs. L, Ioff vs. W, etc.).
Figure 1: Target Modeling Tool Main Window and example of PCM scaling diagram (Ion vs. L).

A dedicated user interface enables you to combine diagrams into multiple plots (IC-CAP's Multiplots). The powerful IC-CAP Plot Optimizer tool enables you to conveniently select model parameters and tune and optimize scaling and I-V plots.

Figure 2: Diagram Configuration Page and an example of MULTIPLOT diagram including several scaling diagrams and one I-V curve.

Powerful simulator links to ADS enables real time tuning performance when simulating multiple devices. The extraction package benefits of an improved IC-CAP link to HSPICE made available with IC-CAP 2006B Add-on 3 and HSPICE 2007.03-SP1.

The IC-CAP Target Modeling Package (85199KL) is available now as part of the current IC-CAP 2008 release. IC-CAP parameter extraction software is available now; contact your local Agilent EEsof EDA sales engineer for pricing.

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